sonic-net · KrisNey-MSFT · Nov 17, 2021 · Oct 15, 2021 · Oct 17, 2021 · Nov 13, 2021
diff --git a/sirius-pipeline/README.md b/sirius-pipeline/README.md
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+# Sirius Pipeline P4 Behavior Models
+**TODO**
diff --git a/test/README.md b/test/README.md
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+# SONiC-DASH Testing
+This directory contains documentation, test scripts, test configurations and other artifacts required to test a SONiC-DASH device or devices.
+
+You can start with the [High-Level Description (HLD) Test Specification](docs/sonic-dash-test-HLD.md)
+## Organization
+Please see the structure below:
+* [docs/](docs) - Test documentation
+* [src/](src) - Source code to build test artifacts
+* [test-cases/](test_cases_) - Directory of test-cases
+* [targets/](targets) - target-specific artifacts, sources and documents
+* [third-party/](third-party) - third-party and external resources used by this project, typically as Git submodules
diff --git a/test/docs/sonic-dash-test-HLD.md b/test/docs/sonic-dash-test-HLD.md
diff --git a/test/images/dash-gnmi-api.svg b/test/images/dash-gnmi-api.svg
diff --git a/test/images/dash-testbed-inband-via-switch.svg b/test/images/dash-testbed-inband-via-switch.svg
diff --git a/test/images/dash-testbed-inband-via-tgen.svg b/test/images/dash-testbed-inband-via-tgen.svg
diff --git a/test/images/dash-testbed-out-of-band-mgmt.svg b/test/images/dash-testbed-out-of-band-mgmt.svg
diff --git a/test/images/dash-testbed-out-of-band-via-iface.svg b/test/images/dash-testbed-out-of-band-via-iface.svg
diff --git a/test/images/dash-testbed-out-of-band-via-proxy.svg b/test/images/dash-testbed-out-of-band-via-proxy.svg
diff --git a/test/images/dash-testbed-ref-arch.svg b/test/images/dash-testbed-ref-arch.svg
diff --git a/test/images/dash-thrift-sai-api.svg b/test/images/dash-thrift-sai-api.svg
diff --git a/test/targets/README.md b/test/targets/README.md
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+# Targets Subdirectory
+This directory contains device/vendor-specific information used to drive tests, for example device SKUs, capabilities, etc.
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		# Targets Subdirectory
		This directory contains device/vendor-specific information used to drive tests, for example device SKUs, capabilities, etc.