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Original file line number Diff line number Diff line change
Expand Up @@ -119,7 +119,7 @@ TEST_F(ClientIVCTests, BasicFailure)
* @brief Prove and verify accumulation of an arbitrary set of circuits
*
*/
TEST_F(ClientIVCTests, BasicLarge)
TEST_F(ClientIVCTests, DISABLED_BasicLarge)
{
ClientIVC ivc;

Expand All @@ -142,7 +142,7 @@ TEST_F(ClientIVCTests, BasicLarge)
* @brief Using a structured trace allows for the accumulation of circuits of varying size
*
*/
TEST_F(ClientIVCTests, BasicStructured)
TEST_F(ClientIVCTests, DISABLED_BasicStructured)
{
ClientIVC ivc;
ivc.structured_flag = true;
Expand Down