Name		Name	Last commit message	Last commit date
parent directory ..
catch2		catch2
esp-idf		esp-idf
pico-sdk		pico-sdk
Arduino.cpp		Arduino.cpp
Arduino.h		Arduino.h
Makefile		Makefile
README.md		README.md
hal_mock.h		hal_mock.h
mbed.cpp		mbed.cpp
mbed.h		mbed.h
mock_brightness_eval.h		mock_brightness_eval.h
pico_mock.cpp		pico_mock.cpp
pico_mock.h		pico_mock.h
pre-commit		pre-commit
test_arduino_hal.cpp		test_arduino_hal.cpp
test_arduino_mock.cpp		test_arduino_mock.cpp
test_brightness.cpp		test_brightness.cpp
test_esp32_hal.cpp		test_esp32_hal.cpp
test_esp32_mock.cpp		test_esp32_mock.cpp
test_esp8266_hal.cpp		test_esp8266_hal.cpp
test_example_morse.cpp		test_example_morse.cpp
test_fadeon_func.cpp		test_fadeon_func.cpp
test_jled.cpp		test_jled.cpp
test_jled_sequence.cpp		test_jled_sequence.cpp
test_main.cpp		test_main.cpp
test_mbed_hal.cpp		test_mbed_hal.cpp
test_pico_hal.cpp		test_pico_hal.cpp

README.md

host based unit tests for JLed

the tests are using the catch unit testing framework.
test results are available on coveralls

Pass OPT argument to make to control optimization, which affects code coverage, e.g.:

make clean coverage OPT=-O0
make clean test OPT=-O2